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Proceedings:... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Resource Type:
E-Journal
Publication:
Los Alamitos, California : CPS, Conference Publishing Services, IEEE Computer Society, [2011]-
Serial Continuity:
Continues: Proceedings [IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems] (ISSN 2377-7966; LCCN 2015201805; OCLC Number 57375271)
Full text available from IEEE Electronic Library (IEL): 1991 to present

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More Details

Contributors:
IEEE Computer Society
IEEE Computer Society > Fault-Tolerant Computing Technical Committee
IEEE Computer Society > Technical Council on Test Technology
IEEE Xplore (Online service)
Meetings:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems , issuing body
Languages:
English
Language Notes:
Item content: English
Main Work:
Proceedings (Online) [IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems]
Other Related Resources:
Print version: Proceedings of the ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems [IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems] (ISSN 2576-1501; LCCN 2017208586; OCLC Number 1010495915)
Alternate Titles:
Abbreviated title: Proc. IEEE Int. Symp. Defect Fault Toler. VLSI Nanotechnol. Syst. (Online)
ISSN key title: Proceedings of the ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Online)
Other title: DFT...
Issues for 2012- have title: Proceedings of the... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Issues for <2015-> have title: Proceedings of the... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
Available from some providers with title, 2011-: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)... IEEE International Symposium on
Available from some providers with title, <2015->: Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)... IEEE International Symposium on
Subjects:
Integrated circuits — Very large scale integration — Design and construction — Congresses
Integrated circuits — Fault tolerance — Congresses
Nanotechnology — Congresses
System Details:
Mode of access: World Wide Web.
General Notes:
Access restricted to subscribing institutions.
Description based on: 2011; title from PDF title page (IEEE Xplore, viewed Mar. 30, 2016).
Latest issue consulted: 2020 (IEEE Xplore, viewed November 16, 2020).
Call Numbers:
Periodical TK7874
ISSNs:
2765-933X
Library of Congress Control Numbers:
2020205096
Other Control Numbers:
ssj0003320731 (source: WaSeSS)