More Details

Contributors:

Institute of Electrical and Electronics Engineers

IEEE Xplore (Online service)

Meetings:

International Symposium on VLSI Design, Automation, and Test

Languages:

English

Language Notes:

Item content: English

Main Work:

Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test (Online) [International Symposium on VLSI Design, Automation, and Test]

Related Works:

IEEE/IET Electronic Library (IEL)

Other Related Resources:

Print verison: Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test [International Symposium on VLSI Design, Automation, and Test] (ISSN 2380-7369; LCCN 2015207171; OCLC Number 919643545)

Alternate Titles:

Abbreviated title: Proc. Tech. Program Int. Symp. VLSI Des. Autom. Test (Online)
ISSN key title: Proceedings of Technical Program of International Symposium on VLSI Design, Automation and Test (Online)
Proceedings of Technical Program of... International Symposium on VLSI Design, Automation & Test
VLSI-DAT...
International Symposium on VLSI Design, Automation & Test
First issue has title: IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT)

Subjects:

Integrated circuits — Very large scale integration — Design and construction — Congresses

Integrated circuits — Very large scale integration — Testing — Congresses

Integrated circuits — Very large scale integration — Congresses

System Details:

Mode of access: World Wide Web.

General Notes:

Access restricted to subscribing institutions.
Description based on: 2006; title from PDF cover (IEEEXplore website, viewed on June 8, 2016).
Latest issue consulted: 2016 (viewed on June 8, 2016).

ISSNs:

2472-9124
2380-7369 [Incorrect]

Library of Congress Control Numbers:

2016202348

Other Control Numbers:

ssj0001616384 (source: WaSeSS)