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Reliability, yield, and stress burn-in: a unified approach for microelectronics systems manufacturing & software development

by Way Kuo, Wei-Ting Kary Chien, Taeho Kim
Resource Type:
Book (Print/Paper)
Publication:
Boston, Mass : Kluwer Academic Publishers, [1998]
Copyright:
©1998

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Author/Creator:
Kuo, Way, 1951-
Contributors:
Chien, Wei-Ting Kary, 1965-
Kim, Taeho, 1960-
Languages:
English
Language Notes:
Item content: English
Main Work:
Reliability, yield, and stress burn-in: a unified approach for microelectronics systems manufacturing & software development [by Kuo, W.]
Subjects:
Integrated circuits — Design and construction — Reliability
Microelectronics — Reliability
Computer software — Development — Reliability
Semiconductors — Computer programs — Reliability
Integrated circuits
Microelectronics
Computer software
Semiconductors
General Notes:
Includes bibliographical references (p. [333]-361) and index.
Physical Description:
xxvi, 394 pages : illustrations ; 24 cm
Call Numbers:
TK7874 .K867 1998
ISBNs:
0792381076 (alk. paper)
Library of Congress Control Numbers:
97039195
OCLC Numbers:
37878683